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FEATURES 250 MHz Operation Driver/Comparator Included 52-Lead LQFP Package with Built-in Heat Sink
High Performance Driver/Comparator on a Single Chip AD53033
FUNCTIONAL BLOCK DIAGRAM
VCC VH 47 VTERM 45 DATA 37 DATAB 38 IOD 43 IODB 42 RLD 49 RLDB 50 VL 31 HCOMP LEH LEHB QH QHB 50 DRIVER VOUT VLDCPL VHDCPL VCC VCC
51 52
VEE
32
VEE
39
VEE
40
VEE
41
APPLICATIONS Automatic Test Equipment Semiconductor Test Systems Board Test Systems Instrumentation and Characterization Equipment
AD53033
PRODUCT DESCRIPTION
COMPARATOR QL QLB LEL LELB LCOMP
The AD53033 is a single chip that performs the pin electronics functions of driver and comparator (D-C) in ATE VLSI and memory testers. The driver is a proprietary design that features three active states: Data High Mode, Data Low Mode and Term Mode as well as an Inhibit State. This facilitates the implementation of high speed active termination. The output voltage range is -3 V to +8 V to accommodate a wide variety of test devices. The output leakage is typically less than 250 nA over the entire signal range. The dual comparator, with an input range equal to the driver output range, features built-in latches and ECL-compatible outputs. The outputs are capable of driving 50 signal lines terminated to -2 V. Signal tracking capability is upwards of 5 V/ns. Also included on the chip is an onboard temperature sensor whose purpose is to give an indication of the surface temperature of the D-C. This information can be used to measure JC and JA or flag an alarm if proper cooling is lost. Output from the
NC
THERM 1.0 A/K
9, 33, 44, 46, 48 2, 5, 8
PWRGND NC = NO CONNECT
ECLGND
HQGND2
sensor is a current sink that is proportional to absolute temperature. The gain is trimmed to a nominal value of 1.0 A/K. As an example, the output current can be sensed by using a 10 k resistor connected from +10 V to the THERM (IOUT) pin. A voltage drop across the resistor will be developed that equals: 10K x 1 A/K = 10 mV/K = 2.98 V at room temperature.
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Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781/329-4700 World Wide Web Site: http://www.analog.com Fax: 781/326-8703 (c) Analog Devices, Inc., 1999
AD53033-SPECIFICATIONS
DRIVER SPECIFICATIONS
(All specifications are at TJ = +85 C 5 C, +VS = +12 V 3%, -VS = -7 V = measured at TJ = +75 C to +95 C). CHDCPL = CLDCPL = 39 nF.
Parameter DIFFERENTIAL INPUT CHARACTERISTICS (DATA to DATA, IOD to IOD, RLD to RLD) Input Voltage Differential Input Range Bias Current REFERENCE INPUTS Bias Currents OUTPUT CHARACTERISTICS Logic High Range Min Typ Max Units
3% unless otherwise noted. All temperature coefficients are
Test Conditions
-2 ECL -250 -50 -2
0 +250 +50 8
V A A V VIN = -2 V, 0.0 V V L , VH , VT = 5 V DATA = H, VH = -2 V to +8 V VL = -3 V (VH = -2 V to +6 V) VL = -1 V (VH = +6 V to +8 V) DATA = L, VL = -3 V to +5 V, VH = +6 V VL = 0.0 V, VH = +0.1 V, VT = 0 V VL = -2 V, VH = +7 V, VT = 0 V DATA = H, VH = 0 V, VL = -3 V, VT = +3 V DATA = H, VH = -2 V to +8 V, VL = -3 V, VT = +3 V DATA = L, VL = -3 V, VH = +6 V, VT = +7.5 V DATA = L, VL = 0 V , VH = +6 V, VT = +7.5 V VL = 0 V, VH = +5 V, VT = 0 V VL = -3 V, VT = 0 V, IOUT = 0, +1, +30 mA VL = -1 V, VT = 0 V, IOUT = 0, -1, -30 mA VH = +6 V, VT = 0 V, IOUT = 0, +1, +30 mA VH = +6 V, VT = 0 V, IOUT = 0, -1, -30 mA VL = 0 V, VT = 0 V, IOUT = -30 mA (Trim Point) CBYP = 39 nF, VH = +7 V, VL = -2 V, VT = 0 V Output to -3 V, VH = +8 V, VL = -1 V, VT = 0 V DATA = H and Output to +8 V, VH = +6 V, VL = -3 V, VT = 0 V, DATA = L TERM MODE, VT = -3 V to +8 V, VL = 0 V, VH = 3 V TERM MODE, VT = 0 V, VL = 0 V, VH = 3 V TERM MODE, VT = -3 V to +8 V, VL = 0 V, VH = 3 V VT = 0 V, VL = 0 V, VH = 3 V IOUT = +30 mA, +1.0 mA, VT = -3.0 V, VH = 3 V, VL = 0 V IOUT = -30 mA, -1.0 mA, VT = +8.0 V, VH = 3 V, VL = 0 V IOUT = 30 mA, 1.0 mA, VT = 0 V, VH = 3 V, VL = 0 V Measured at 50%, VH = +400 mV, VL = -400 mV Measured at 50%, VH = +400 mV, VL = -400 mV Measured at 50%, VH = +400 mV, VL = -400 mV Measured 20%-80%, VL = 0 V, VH = 1 V Measured 20%-80%, VL = 0 V, VH = 3 V Measured 10%-90%, VL = 0 V, VH = 5 V Measured 10%-90%, VL = -2 V, VH = 7 V Measured 20%-80%, VL = 0 V, VH = 1 V Measured 20%-80%, VL = 0 V, VH = 3 V Measured 10%-90%, VL = 0 V, VH = 5 V VL, VH = -0.1 V, 0.1 V, VL, VH = 0.0 V, 1.0 V VL, VH = 0.0 V, 3.0 V, VL, VH = 0.0 V, 5.0 V VL, VH = -2.0 V, 7.0 V VL = 0 V, VH = 0.5 V VL = 0 V, VH = 0.5 V
Logic Low Range Amplitude (VH and VL) Absolute Accuracy VH Offset VH Gain + Linearity Error VL Offset VL Gain + Linearity Error Offset TC Output Resistance VH = -2 V VH = +8 V VL = -3 V VL = +5 V VH = +3 V Dynamic Current Limit Static Current Limit
-3 0.1 -50 0.3 - 5 -50 -0.3 - 5 0.5 44 44 44 44 100 -85 46 46 46 46 46
5 9 +50 +0.3 + 5 +50 +0.3 + 5
V V mV % of VH + mV mV % of VL + mV mV/C mA mA
48 48 48 48
+85
VTERM Voltage Range VTERM Offset VTERM Gain + Linearity Error Offset TC Output Resistance
-3 -50 -0.3 + 5 44 0.5 46
8.0 +50 +0.3 + 5 49
V mV % of VSET + mV mV/C
DYNAMIC PERFORMANCE, (VH AND VL) Propagation Delay Time Propagation Delay TC Delay Matching, Edge to Edge Rise and Fall Times 1 V Swing 3 V Swing 5 V Swing 9 V Swing Rise and Fall Time Temperature Coefficient 1 V Swing 3 V Swing 5 V Swing Overshoot and Preshoot
1.1
1.6 2.1 2 <100 0.6 1.0 1.7 3.0 1 2 4
ns ps/C ps ns ns ns ns ps/C ps/C ps/C % of Step + mV
-3.0 - 50
+3.0 + 50
Settling Time to 15 mV to 4 mV
<50 <10
ns s
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AD53033
Parameter Delay Change vs. Pulsewidth Minimum Pulsewidth 3 V Swing 5 V Swing Toggle Rate DYNAMIC PERFORMANCE, INHIBIT Delay Time, Active to Inhibit Delay Time, Inhibit to Active Delay Time Matching (Z) 1.5 1.5 Min Typ <50 2 3 250 4.0 3.5 2.2 Max Units ps ns ns MHz ns ns ns Test Conditions VL = 0 V, VH = 2 V VL = 0 V, VH = 3 V, 90% Reached, Measure @ 50% VL = 0 V, VH = 5 V, 90% Reached, Measure @ 50% VL = 0 V, VH = 5 V, VDUT > 3.0 V p-p Measured at 50%, VH = +2 V, VL = -2 V Measured at 50%, VH = +2 V, VL = -2 V Z = Delay Time Active to Inhibit Test (Above)-- Delay Time Inhibit to Active Test (Above) (Of Worst Two Edges) VH = 0 V, VL = 0 V VH = +2 V, VL = -2 V (Measured 20%/80% of 1 V Output) VH = +2 V, VL = -2 V (Measured 20%/80% of 1 V Output) Measured at 50%, VL = VH = +0.4 V, VTERM = -0.4 V Measured at 50%, VL = VH = +0.4 V, VTERM = -0.4 V Measured at 50%, VL = VH = +0.4 V, VTERM = -0.4 V VH/VL, VTERM = (+0.4 V, -0.4 V), (0.0 V, -2.0 V), (0.0 V, +7.0 V) VL, VH = 0 V, VTERM = -2 V, 20%-80% VL, VH = 0 V, VTERM = -2 V, 20%-80% VS = VS 3%
I/O Spike Rise, Fall Time, Active to Inhibit Rise, Fall Time, Inhibit to Active DYNAMIC PERFORMANCE , VTERM Delay Time, VH to VTERM Delay Time, VL to VTERM Delay Time, VTERM to VH and VTERM to VL Overshoot and Preshoot VTERM Mode Rise Time VTERM Mode Fall Time PSRR, DRIVE or TERM Mode
Specifications subject to change without notice.
<200 3.5 2.2 3.0 5.0 4.0 +3.0 + 75 4.0 5.5 35
mV, p-p ns ns ns ns ns % of Step + mV ns ns dB
-3.0 + 75
COMPARATOR SPECIFICATIONS
(All specifications are at TJ = +85 C measured at TJ = +75 C to +95 C).
Parameter DC INPUT CHARACTERISTICS Offset Voltage (VOS) Offset Voltage (Drift) HCOMP, LCOMP Bias Current Voltage Range (VCM) Differential Voltage (VDIFF) Gain and Linearity LATCH ENABLE INPUTS Logic "1" Current (IIH) Logic "0" Current (IIL) DIGITAL OUTPUTS Logic "1" Voltage (VOH) Logic "0" Voltage (VOL) Slew Rate SWITCHING PERFORMANCE Propagation Delay Input to Output Latch Enable to Output Propagation Delay Temperature Coefficient Propagation Delay Change with Respect to Slew Rate: 0.5 V, 1.0 V, 3.0 V/ns Slew Rate: 5.0 V/ns Amplitude: 1.0 V, 3.0 V, 5.0 V Equivalent Input Rise Time Pulsewidth Linearity Settling Time Latch Timing Input Pulsewidth Setup Time Hold Time
Specifications subject to change without notice.
5 C, +VS = +12 V
Min -25 50 -50 -3 -0.05
3%, -VS = -7 V =
Typ Max 25 50 8.0 9.0 0.05 250 Units
3% unless otherwise noted. All temperature coefficients are
Test Conditions CMV = 0 V CMV = 0 V VIN = 0 V
mV V/C A V V % FSR A A V V V/ns
VIN = -3 V to +8 V LE, LE = -0.8 V LE, LE = -1.8 V Q or Q, 50 to -2 V Q or Q, 50 to -2 V
-250 -0.98 -1.5 1
0.9 2 2 < 100 < 350 < 200 450 < 200 <25 <1.5 <1.0 <1.0
2.5
ns ns ps/C ps ps ps ps ps ns ns ns ns
VIN = 2 V p-p, HCOMP = +1 V, LCOMP = +1 V
VIN = 0 V to 5 V VIN = 0 V to 5 V VIN = 1.0 V/ns VIN = 0 V to 3 V, 3 V/ns VIN = 0 V to 3 V, 3 V/ns, PW = 3 ns-8 ns Settling to 8 mV, VIN = 1 V to 0 V
REV. 0
-3-
AD53033-SPECIFICATIONS
TOTAL FUNCTION SPECIFICATIONS
(All specifications are at TJ = +85 C measured at TJ = +75 C to +95 C).
Parameter OUTPUT CHARACTERISTICS Output Leakage Current, VOUT = -2 V to +7 V Output Leakage Current, VOUT = -3 V to +8 V Output Capacitance POWER SUPPLIES Total Supply Range Positive Supply Negative Supply Positive Supply Current Negative Supply Current Total Power Dissipation Temperature Sensor Gain Factor
5 C, +VS = +12 V
Min -500 -2
3%, -VS = -7 V =
Typ Max +500 +2 6 19 12 -7 178 195 3.5 1.4
3% unless otherwise noted. All temperature coefficients are
Units nA A pF V V V mA mA W A/K
Test Conditions
Driver INHIBITED
0.7
1
Driver = Active Driver = Active Driver = Active RLOAD = 10 k, VSOURCE = +10 V
NOTES Connecting or shorting the decoupling pins to ground will result in the destruction of the device. Specifications subject to change without notice.
Table I. Driver Truth Table
DATA 0 1 X X
DATA 1 0 X X
IOD 1 1 0 0
IOD 0 0 1 1
RLD X X 0 1
RLD X X 1 0
OUTPUT STATE VL VH INH VTERM
Table II. Comparator Truth Table
VOUT >HCOMP >HCOMP LCOMP LCOMP LEH 1 1 1 1 0
LEH 0 0 0 0 1
LEL 1 1 1 1 0
LEL 0 0 0 0 1
QH
OUTPUT STATES QH QL 0 0 1 1 QH (t-1) 1 0 1 0 QL (t-1)
QL 0 1 0 1 QL (t-1)
1 1 0 0 QH (t-1)
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AD53033
ABSOLUTE MAXIMUM RATINGS 1
Power Supply Voltage +VS to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +13 V -VS to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -8 V +VS to -VS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +20 V PWR GND to ECL GND or HQ GND . . . . . . . . . . 0.4 V Inputs DATA, DATA, IOD, IOD, RLD, RLD . . . . . . +5 V, -3 V DATA to DATA, IOD to IOD, RLD to RLD . . . . . . . 3 V LEL, LEL, LEH, LEH . . . . . . . . . . . . . . . . . . . +5 V, -3 V LEL to LEL, LEH to LEH . . . . . . . . . . . . . . . . . . . . . 3 V VH, VL, VTERM to GND . . . . . . . . . . . . . . . . +9 V, -4 V VH to VL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 V (VH - VTERM) and (VTERM - VL) . . . . . . . . . . . . 11 V HCOMP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +9 V, -4 V LCOMP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +9 V, -4 V HCOMP, LCOMP to VOUT . . . . . . . . . . . . . . . . . . . 11 V Outputs VOUT Short Circuit Duration . . . . . . . . . . . . . . . . Indefinite2 VOUT Inhibit Mode . . . . . . . . . . . . . . . . . . . . . . . +9 V, -4 V VHDCPL . . . . . . . . Do Not Connect Except for Cap to VCC VLDCPL . . . . . . . . Do Not Connect Except for Cap to VEE QH, QH, QL, QL Maximum IOUT Continuous . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 mA Surge . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .100 mA THERM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +13 V, 0 V
Environmental Operating Temperature (Junction) . . . . . . . . . . . . . . +175C Storage Temperature . . . . . . . . . . . . . . . . -65C to +150C Lead Temperature (Soldering, 10 sec)3 . . . . . . . . . . +260C
NOTES 1 Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Absolute maximum limits apply individually, not in combination. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. 2 Output short circuit protection to ground is guaranteed as long as proper heat sinking is employed to ensure compliance with the operating temperature limits. 3 To ensure lead coplanarity ( 0.002 inches) and solderability, handling with bare hands should be avoided and the device should be stored in environments at 24 C 5C (75F 10F) with relative humidity not to exceed 65%.
Table III. Package Thermal Characteristics
Air Flow, FM 0 200 400
JA,
C/W
33 25 22
ORDERING GUIDE
Model AD53033JSTP
Package Description 52-Lead LQFP-EDQUAD
Shipment Method Quantity per Shipping Container 90
Package Option SQ-52
CAUTION ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the AD53033 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
REV. 0
-5-
AD53033
PIN CONFIGURATION
RLD PWRGND
VH PWRGND
VTERM
PWRGND
RLDB
IOD IODB VEE
VCC VCC
VEE
52 51 50 49 48 47 46 45 44 43 42 41 40
VCC 1 ECLGND 2 QLB 3 QL 4 ECLGND QHB QH ECLGND
5 6 7 8
PIN 1 IDENTIFIER
39 V EE 38 DATAB 37 DATA 36 NC 35 NC
AD53033
HEAT SINK UP (Not to Scale)
34 NC 33 PWRGND 32 VEE 31 VL 30 NC 29 NC 28 NC 27 NC
PWRGND 9 LELB 10 LEL 11 LEHB 12 LEH 13
14 15 16 17 18 19 20 21 22 23 24 25 26
HCOMP LCOMP
THERM
NC
NC NC
NC NC
NC = NO CONNECT
OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
52-Lead LQFP-EDQUAD with Integral Heat Slug (SQ-52)
0.063 (1.60) MAX 0.030 (0.75) 0.024 (0.60) 0.018 (0.45) SEATING PLANE 0.630 (16.00) SQ 0.551 (14.00) SQ
52 1 40 39
VHDCPL HQGND2
VLDCPL
VOUT
NC
TOP VIEW
(PINS DOWN)
0.270 (6.86) DIA
STANDOFF 0.004 (0.10) MAX 0.006 (0.15) 0.002 (0.05)
13 14 26
27
0.020 (0.50) 0.017 (0.42) 0.014 (0.35) CENTER FIGURES ARE TYPICAL UNLESS OTHERWISE NOTED
0.008 (0.20) 0.004 (0.09)
0.039 (1.00) BSC
7 3.5 0
-6-
REV. 0
PRINTED IN U.S.A.
0.057 (1.45) 0.055 (1.40) 0.053 (1.35)
C3517-2-2/99

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